Microelectronics Reliability

Availability: free for staff and students of Hamburg University of Applied Sciences
Licensed Period: Elsevier DEAL Archive: Vol. 1 (1962) - Vol. 139 (2022)   ReadMe
Licensed Period: Vol. 35 (1995) - Vol. 79 (2017)   ReadMe
Homepage(s):
Fulltext available since: Volume 1 , H. 1 (1962)
Publisher: Elsevier
ZDB-ID: 2022028-5
Subject(s):
Tag(s): Mikroelektronik
E-ISSN(s): 1872-941X
P-ISSN(s): 0026-2714
Appearance: Fulltext, online and print
Costs: subject to fee
Comment: Volltextzugang über die Datenbank ScienceDirect (kostenpflichtig). Titel bis 37.1997: Microelectronics and Reliability
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